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Leveraging accelerated testing to assess the reliability of two-stage and muiti-channel drivers
Davis, J. L., Perkins, C., Smith, A., Clark, T., & Mills, K. (2017). Leveraging accelerated testing to assess the reliability of two-stage and muiti-channel drivers. In 2017 18th International conference on thermal, mechanical and multi-physics simulation and experiments in microelectronics and microsystems (eurosime) IEEE.
The next wave of LED lighting technology is likely to be tunable white lighting (TWL) devices which can adjust the colour of the emitted light between warm white (similar to 2700 K) and cool white (similar to 6500 K). This type of lighting system uses LED assemblies of two or more colours each controlled by separate driver channels that independently adjust the current levels to achieve the desired lighting colour. Drivers used in TWL devices are inherently more complex than those found in simple SSL devices, due to the number of electrical components in the driver required to achieve this level of control. The reliability of such lighting systems can only be studied using accelerated stress tests (AST) that accelerate the aging process to time frames that can be accommodated in laboratory testing. This paper describes AST methods and findings developed from AST data that provide insights into the lifetime of the main components of one-channel and multi-channel LED devices. The use of AST protocols to confirm product reliability is necessary to ensure that the technology can meet the performance and lifetime requirements of the intended application.
