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Failure mechanisms and color stability in light-emitting diodes during operation in high-temperature environments in the presence of contamination
Lall, P., Zhang, H., & Davis, J. (2015). Failure mechanisms and color stability in light-emitting diodes during operation in high-temperature environments in the presence of contamination. In 2015 IEEE 65th Electronic Components and Technology Conference (pp. 1624 - 1632)
