Analytical Lab Services

The analytical scientists at RTI command a diverse range of techniques to assist you with your materials characterization needs. We can help answer your questions about defects, failure analysis, thin-film composition and microstructure, semiconductor characterization, surface topography, and other materials properties.

Analytical Techniques

Surface elemental analysis
Surface chemical bonding
Depth profiling
Bulk elemental analysis
Film thickness and optical constants
Surface morphology and roughness
Microscopy and imaging
Radiographic analysis

Industries and Technologies

Adhesives
Biomedical
Chemicals
Flat panel displays
IC packaging
Lighting
Microelectromechanical systems (MEMS)
Nanotechnology
Non-ferrous metals
Optical disk drives
Polymers
Powdered metals
Semiconductors
Steel
Textiles

Analytical Capabilities

Scanning electron microscopy (SEM)		Used for high-magnification imaging of sample surfaces, characterizing surface topography, measuring line widths, and determining material properties.
Energy dispersive spectroscopy (EDS)		Used in conjunction with SEM to provide elemental detection at local areas of interest on a sample.
X-ray photoelectron spectroscopy (XPS)		A chemical analysis technique that provides surface elemental analysis and chemical bonding information. Minimal sample preparation is required, and nondestructive depth information can be obtained. Compositional depth profiles can also be obtained by sputtering through the desired layers during analysis. Also known as Electron Spectroscopy for Chemical Analysis (ESCA).
Atomic force microscopy (AFM)		A technique that provides high-resolution surface morphology data for solid samples.

Fourier-transform infrared (FTIR) spectroscopy		An optical characterization technique used to determine the molecular structure of unknown samples by measuring the frequencies of infrared (IR) radiation that are absorbed by the sample. The IR absorption spectrum can then be matched to that of a known material to establish the identity of the chemical substance.
X-ray fluorescence (XRF)		A nondestructive technique which uses X-rays to measure the thickness and composition of materials, including thin-film layers.
X-ray radiographic imaging		X-rays are used to view the interior of objects, such as semiconductor devic packages, nondestructively.
Scanning ellipsometry		A nondestructive, optical characterization technique that uses multiple wavelengths of light to characterize the thickness and optical constants of thin-film materials.